| 학회 |
한국고분자학회 |
| 학술대회 |
2015년 봄 (04/08 ~ 04/10, 대전컨벤션센터) |
| 권호 |
40권 1호 |
| 발표분야 |
고분자구조 및 물성 |
| 제목 |
Study of Electrical Memory Characteristics of an Oxadiazole-based Brush Polymer in Nanoscale Thin Films |
| 초록 |
The self-assembly characteristics in nanoscale thin films and electrical memory behaviors of PPOXBPA, a well-defined brush polymer based oxadiazole moieties were investigated. The synchrotron grazing incidence X-ray scattering analysis found that the brush polymer molecules in thin films formed a multibilayer structure based on a fully extended backbone and bristle conformation. The as-cast films had a relatively low crystallinity and formed a vertical multibilayer structure with a broad orientational distribution, whereas the thermal-annealed films had a high crystallinity and formed an almost perfectly horizontal-oriented multibilayer structure. These different morphologies led different electrical memory modes in devices; the as-cast films revealed volatile memory behavior, whereas the thermal-annealed films showed permanent memory characteristics. This brush polymer is programmable volatile and nonvolatile memory devices via control of the morphological structure. |
| 저자 |
이진석, 권원상, 안병철, 김용진, 김영용, 고용기, 정성민, 권경호, 김종현, 위동우, 송성진, 김창섭, 이종찬, 이호열, Brian J. Ree, 윤현경, 이문호
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| 소속 |
포항공과대 |
| 키워드 |
oxadiazole-containing brush polymer; self-assembly; multibilayer structure; grazing incidence X-ray scattering; digital memory behaviors
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| E-Mail |
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