| 학회 |
한국고분자학회 |
| 학술대회 |
2004년 봄 (04/09 ~ 04/10, 고려대학교) |
| 권호 |
29권 1호, p.53 |
| 발표분야 |
고분자 구조 및 물성 |
| 제목 |
GIXS, XR, Ellipsometry, and AFM Studies on Polymers and Composites in Nanoscale Films |
| 초록 |
We recently developed 2-dimensional grazing incident X-ray scattering (GIXS) technique and applied this technique for a number of polymers and their mixture systems in nanoscale thin films. It was found that this GIXS technique is a very powerful tool to characterize morphological structures in nanoscale films which conventional scattering methods could not be able. On the other hand, X-ray reflectivity (XR), spectroscopic ellipsometry, and atomic force microscopy (AFM) are widely used for characterizing nanoscale films. Using GIXS along with XR, ellipsometry, and AFM, we investigated morphological structures of nanoporous organosilicates, polypeptides, polyesters, and block copolymers in nanofilms. The results will be in detail discussed with taking into account the cheimcal nature of the polymers, the preparation condition of nanoscale films, and the nature of substrates employed. |
| 저자 |
이문호1, 이병두2, 황용택3, 오원태4, 박영희5, 윤진환1, 진경식2, 허규용3, 진상우4, 김제한5, 김광우1
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| 소속 |
1포항공과대, 2환경공학부, 3기능성분자집합체연구센터, 4고분자(연), 5포항가속기(연) |
| 키워드 |
GIXS; AFM. Ellipsometry; Nanoscale Films
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| E-Mail |
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