| 학회 |
한국고분자학회 |
| 학술대회 |
2008년 가을 (10/09 ~ 10/10, 일산킨텍스) |
| 권호 |
33권 2호 |
| 발표분야 |
고분자 구조 및 물성 |
| 제목 |
Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing incidence X-ray scattering |
| 초록 |
Brush polymers have received much attention from both academia and industry because of their potential applications in microelectronic devices, flat panel display devices, optical and optoelectronic devices, adhesives and gas separation membranes. Interestingly, the brush polymers revealed self-assembly behavior in the n-alkyl side chains. Due to their potential applications, and interesting self-assembly characteristics, much research effort has devoted to synthesizing new brush polymers and investigating their structures and properties. In this study, we developed a grazing incidence X-ray scattering (GIXS) formula for the quantitative analysis of lamellar stack structures formed in polymer thin films, and used it to characterize two-dimensional (2D) GIXS patterns measured for lamellar structures in nanometer-scaled thin films of the brush polymer, poly(oxy(n-decylthiomethylenyl)ethylene) (PODTE) |
| 저자 |
김진철1, 이문호1, 윤진환1, 김현철2, 허규용1, 진경식1, 진상우1, 김가희1, 함석규1, 이택준1, 박삼대1, 김동민1, 권원상1, 노예철1, 안병철1, 정정운1, 김경태1
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| 소속 |
1포항공과대, 2대구경북과학기술원 나노바이오연구부 |
| 키워드 |
brush polymer; poly(epichlorohydrin); self assembly
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| E-Mail |
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