| 학회 |
한국고분자학회 |
| 학술대회 |
2007년 봄 (04/12 ~ 04/13, 제주 ICC) |
| 권호 |
32권 1호 |
| 발표분야 |
고분자 구조 및 물성 |
| 제목 |
Quantitative Analysis of Lamellar Structures in Side-Chain Crystalline Polymer Thin Films by Synchrotron Grazing Incidence X-ray Scattering |
| 초록 |
We demonstrate a quantitative, nondestructive analysis of side chain crystalline polymer thin films supported on substrates by using grazing incidence X-ray scattering (GIXS) and data analysis with a derived scattering theory. We derived a GIXS formula to quantitatively analyze GIXS patterns for lamellar structures in substrate-supported nanoscale thin films. We applied this formula in the quantitative analysis of GIXS patterns obtained for poly[oxy(n-decylthiolmethyl)ethylene] (PODTE) thin films on silicon substrates for various temperatures. This analysis successfully provided information on the structural parameters and orientation of the lamellar structure developed in PODTE thin films. Finally, molecular structure model and electron density profiles are established from obtained structural information. |
| 저자 |
윤진환, 진경식, 김현철, 허규용, 진상우, 안병철, 이문호
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| 소속 |
포항공과대 |
| 키워드 |
GIXS; Lamellar Structure; Side-chain Crystalline Polymer
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| E-Mail |
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