| 초록 |
Recently, an encapsulation technique using a glass or metal lid has been proposed as a method to protect devices from oxygen and water vapors. However, these types of seals are very expensive to fabricate and heavy, thick and rigid severely limit their applications of organic light emitting devices (OLEDs). For thin and lightweight encapsulation of OLEDs, it is necessary to develop a thin film passivation technique. In this study, we used single and double layered passivation films (silicon monoxide, silicon monoxide/aluminum dioxide). Silicon monoxide (SiOx) film was prepared by thermal evaporation and aluminum dioxide (Al2O3) was deposited over the polyimide coated layer by RF sputtering. As a result, the initial luminance of the single layer passivated device decayed to 50% of its initial luminance after 200h whereas non-passivated device did only after 75h. |
