화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Investigation of avalanche ruggedness of 650 V Schottky-barrier rectifiers
Konstantinov A, Pham H, Lee B, Park KS, Kang B, Allerstam F, Neyer T
Solid-State Electronics, 148, 51, 2018
2 Field Effect Mobility in n-channel Si face 4H-SiC MOSFET with Gate oxide Grown on Aluminium Ion-implanted Material
Gudjonsson G, Olafsson HO, Allerstam F, Nilsson PA, Sveinbjornsson EO, Rodle T, Jos R
Materials Science Forum, 483, 833, 2005
3 High Field-Effect Mobility in 6H-SiC MOSFET with Gate Oxides Grown in Alumina Environment
Allerstam F, Gudjonsson G, Olafsson HO, Sveinbjornsson EO, Rodle T, Jos R
Materials Science Forum, 483, 837, 2005
4 High Field Effect Mobility in Si Face 4H-SiC MOSFET Made on Sublimation Grown Epitaxial Material
Sveinbjornsson EO, Olafsson HO, Gudjonsson G, Allerstam F, Nilsson PA, Syvajarvi M, Yakimova R, Hallin C, Rodle T, Jos R
Materials Science Forum, 483, 841, 2005
5 On shallow interface states in n type 4H-SiC metal-oxide-semiconductor structures
Olafsson HO, Allerstam F, Sveinbjornsson EO
Materials Science Forum, 389-3, 1005, 2002