검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon Pepponi G, Giubertoni D, Bersani M, Meirer F, Ingerle D, Steinhauser G, Streli C, Hoenicke P, Beckhoff B Journal of Vacuum Science & Technology B, 28(1), C1C59, 2010 |
| 2 |
Fabrication of As-doped p-type ZnO thin films using As2O3 as doping source material by E-beam evaporation Kumar M, Choi SY Applied Surface Science, 255(5), 2173, 2008 |