검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Scanning probe metrology in the presence of surface charge Griffith JE, Kneedler EM, Ningen S, Berghaus A, Bryson CE, Pau S, Houge E, Shofner T Journal of Vacuum Science & Technology B, 18(6), 3264, 2000 |
| 2 |
Characterisation of CVD-tungsten-alumina cermets for high-temperature selective absorbers Berghaus A, Djahanbakhsh A, Thomas LK Solar Energy Materials and Solar Cells, 54(1), 19, 1998 |
| 3 |
Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor Griffith JE, Hopkins LC, Bryson CE, Berghaus A, Snyder EJ, Plombon JJ, Vasilyev LA, Hecht M, Bindell JB Journal of Vacuum Science & Technology B, 15(6), 2189, 1997 |