검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Universal model of bias-stress-induced instability in inkjet-printed carbon nanotube networks field-effect transistors Jung H, Choi S, Jang JT, Yoon J, Lee J, Lee Y, Rhee J, Ahn G, Yu HR, Kim DM, Choi SJ, Kim DH Solid-State Electronics, 140, 80, 2018 |
| 2 |
Extraction method of trap densities for indium zinc oxide thin-film transistors processed by solution method Qiang L, Liang XC, Pei YL, Yao RH, Wang G Thin Solid Films, 649, 51, 2018 |
| 3 |
Storage-period dependent bias-stress instability of solution-processed amorphous indium-zinc-oxide thin-film transistors Kim JH, Kim J, Jeong SM, Jeong J Current Applied Physics, 15, S64, 2015 |
| 4 |
Investigation of co-sputtered LiZnSnO thin film transistors Jung HY, Park SY, Kim JI, Yang H, Choi R, Kim DH, Bae JU, Shin WS, Jeong JK Thin Solid Films, 522, 435, 2012 |
| 5 |
Negative bias-temperature stress in non-self-aligned p-channel polysilicon TFTs Mariucci L, Gaucci P, Valletta A, Cuscuna M, Maiolo L, Pecora A, Fortunato G Thin Solid Films, 517(23), 6379, 2009 |