검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Optical, structural and electrical characterizations of stacked Hf-based and silicon nitride dielectrics Khomenkova L, Normand P, Gourbilleau F, Slaoui A, Bonafos C Thin Solid Films, 617, 143, 2016 |
| 2 |
Ge nanocrystals in HfO2/SiN dielectric stacks by low energy ion beam synthesis Carrada M, Sahu BS, Bonafos C, Gloux F, Groenen J, Muller D, Slaoui A Thin Solid Films, 543, 94, 2013 |
| 3 |
Electrical Transport at Room and Low Temperature in 3D Vertically Stacked SiGe and SiGeC Nanowires Diab A, Saracco E, Ionica I, Bonafos C, Damlencourt JF, Lee JH, Cristoloveanu S Journal of the Electrochemical Society, 159(4), H467, 2012 |
| 4 |
Si nanocrystals by ultra-low-energy ion beam-synthesis for non-volatile memory applications Bonafos C, Coffin H, Schamm S, Cherkashin N, Ben Assayag G, Dimitrakis P, Normand P, Carrada M, Paillard V, Claverie A Solid-State Electronics, 49(11), 1734, 2005 |
| 5 |
Characterization of silicon nanocrystals embedded in thin oxide layers by TOF-SIMS Perego M, Ferrari S, Fanciulli M, Ben Assayag G, Bonafos C, Carrada M, Claverie A Applied Surface Science, 231-2, 813, 2004 |
| 6 |
Silicon nanocrystal memory devices obtained by ultra-low-energy ion-beam synthesis Dimitrakis P, Kapetanakis E, Tsoukalas D, Skarlatos D, Bonafos C, Ben Asssayag G, Claverie A, Perego M, Fanciulli M, Soncini V, Sotgiu R, Agarwal A, Ameen M, Sohl C, Normand P Solid-State Electronics, 48(9), 1511, 2004 |
| 7 |
Optical and structural characterization of Si nanocrystals ion beam synthesized in SiO2: correlation between the surface passivation and the photoluminescence emission Lopez M, Garrido B, Bonafos C, Perez-Rodriguez A, Morante JR Solid-State Electronics, 45(8), 1495, 2001 |
| 8 |
Optical characterization of thermally oxidized Si1-x-yGexCy layers Cuadras A, Garrido B, Bonafos C, Morante JR, Fonseca L, Franz M, Pressel K Thin Solid Films, 364(1-2), 233, 2000 |