검색결과 : 1건
No. | Article |
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1 |
Cu bump interconnections in 20 mu m-pitch at low temperature utilizing electroless tin-plating on 3D stacked LSI Tomita Y, Morifuji T, Tomisaka M, Sunohara M, Nemoto Y, Sato T, Takahashi K, Bonkohara M Journal of Chemical Engineering of Japan, 36(2), 119, 2003 |