검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Characterization of 4H-SiC epitaxial layers by microwave photoconductivity decay Kumar RJ, Losee PA, Li C, Seiler J, Bhat IB, Chow TP, Borrego JM, Gutmann RJ Materials Science Forum, 483, 405, 2005 |
| 2 |
Measurement of the Sheet Resistance of Doped Layers in Semiconductors by Microwave Reflection Bhimnathwala H, Borrego JM Journal of Vacuum Science & Technology B, 12(1), 395, 1994 |