검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates Branger V, Coupeau C, Goudeau P, Boubeker B, Badawi KF, Grilhe J Journal of Materials Science Letters, 19(4), 353, 2000 |
| 2 |
Study of the Mechanical and Microstructural State of Platinum Thin-Films Branger V, Pelosin V, Badawi KF, Goudeau P Thin Solid Films, 275(1-2), 22, 1996 |
| 3 |
Residual-Stresses Influence on the Structural Evolution of Cu-Mo Solid-Solutions Studied by X-Ray-Diffraction Goudeau P, Mimault J, Girardeau T, Reklaoui K, Proux O, Branger V Thin Solid Films, 275(1-2), 25, 1996 |
| 4 |
Profile Analysis of Thin-Film X-Ray-Diffraction Peaks Bimbault L, Badawi KF, Goudeau P, Branger V, Durand N Thin Solid Films, 275(1-2), 40, 1996 |
| 5 |
X-Ray-Diffraction Study of the Substructure Modification Induced by Residual-Stresses During the Deposition Process of 304L Stainless-Steel Films Goudeau P, Boubeker B, Eymery JP, Branger V Thin Solid Films, 275(1-2), 188, 1996 |