| 1 |
Oxide Growth Mechanism on Mg AZ91 Alloy by Anodizing: Combination of Electrochemical and Ellipsometric In-Situ Measurements
Zimmer A, Veys-Renaux D, Broch L, Stein N, Rocca E
Journal of the Electrochemical Society, 164(14), C1059, 2017 |
| 2 |
Ellipsometry of Colloidal Solutions: New Experimental Setup and Application to Metallic Colloids
Battie Y, Stchakovsky M, Naciri AE, Akil S, Chaoui N, Broch L
Langmuir, 33(30), 7425, 2017 |
| 3 |
Growth Mechanism during the Early Stages of electrodeposition of Bismuth telluride films
Zimmer A, Broch L, Boulanger C, Stein N
Electrochimica Acta, 174, 376, 2015 |
| 4 |
Design of a real-time spectroscopic rotating compensator ellipsometer without systematic errors
Broch L, Stein N, Zimmer A, Battie Y, Naciri AE
Thin Solid Films, 571, 509, 2014 |
| 5 |
Study of the potential driven changes in a collagen film self-assembled on a polycrystalline gold electrode surface
Ahlers M, Stein N, Broch L, Brand I
Journal of Electroanalytical Chemistry, 706, 140, 2013 |
| 6 |
Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators
Broch L, Naciri AE, Johann L
Thin Solid Films, 519(9), 2601, 2011 |
| 7 |
Accurate calibration and optimized measurement: use of an achromatic compensator in rotating polarizer spectroscopic ellipsometry
Broch L, Naciri AE, Johann L
Thin Solid Films, 455-56, 61, 2004 |
| 8 |
In situ ellipsometric and electrochemical monitoring of the oxidation of a Pb-Ca-Sn alloy used in the lead acid batteries
Stein N, Bourguignon G, Raboin L, Broch L, Johann L, Rocca E
Thin Solid Films, 455-56, 735, 2004 |
| 9 |
Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe
Johann L, Naciri AE, Broch L, Demange V, Ghambaja J, Machizaud F, Dubois JM
Applied Surface Science, 207(1-4), 300, 2003 |
| 10 |
Fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometer: accurate calibration method, effect of errors and testing
Naciri AE, Broch L, Johann L, Kleim R
Thin Solid Films, 406(1-2), 103, 2002 |
