검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Measurement of Silicon Particles by Laser-Surface Scanning and Angle-Resolved Light-Scattering Huff HR, Goodall RK, Williams E, Woo KS, Liu BY, Warner T, Hirleman D, Gildersleeve K, Bullis WM, Scheer BW, Stover J Journal of the Electrochemical Society, 144(1), 243, 1997 |
| 2 |
Interpretation of Carrier Recombination Lifetime and Diffusion Length Measurements in Silicon Bullis WM, Huff HR Journal of the Electrochemical Society, 143(4), 1399, 1996 |