검색결과 : 4건
No. | Article |
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1 |
UHV reflection electron microscopy investigation of the monoatomic steps on the silicon (111) surface at homo- and heteroepitaxial growth Latyshev AV, Krasilnikov AB, Aseev AL Thin Solid Films, 306(2), 205, 1997 |
2 |
Relaxation of the Step Profile for Different Microscopic Mechanisms Liu DJ, Fu ES, Johnson MD, Weeks JD, Williams ED Journal of Vacuum Science & Technology B, 14(4), 2799, 1996 |
3 |
Schwoebel Barriers on Si(111) Steps and Kinks Kodiyalam S, Khor KE, Dassarma S Journal of Vacuum Science & Technology B, 14(4), 2817, 1996 |
4 |
Scanning-Tunneling-Microscopy on Quenched Si(111) Surfaces Teufel L, Heuell P, Kulakov MA, Bullemer B Thin Solid Films, 264(2), 236, 1995 |