검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Composition dependence of InP/GaxIn1-xAsyP1-y/InP interface structures analyzed by X-ray CTR scattering measurements Tabuchi M, Kyouzu H, Takemi M, Takeda Y Applied Surface Science, 216(1-4), 526, 2003 |
| 2 |
Atomic scale characterization of GaInN/GaN layers grown on sapphire substrates with low-temperature deposited AlN buffer layers Tabuchi M, Kyouzu H, Takeda Y, Yamaguchi S, Amano H, Akasaki I Journal of Crystal Growth, 237, 1133, 2002 |
| 3 |
Characterization of SOI wafers by X-ray CTR scattering Shimura T, Hosoi T, Umeno M Journal of Crystal Growth, 210(1-3), 98, 2000 |