검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Surface quantification by ion implantation through a removable layer Stevie FA, Roberts RF, McKinley JM, Decker MA, Granger CN, Santiesteban R, Hitzman CJ Journal of Vacuum Science & Technology B, 18(1), 483, 2000 |
| 2 |
Nanoscale elemental imaging of semiconductor materials using focused ion beam secondary ion mass spectrometry Stevie FA, Downey SW, Brown SR, Shofner TL, Decker MA, Dingle T, Christman L Journal of Vacuum Science & Technology B, 17(6), 2476, 1999 |