검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Quick turnaround technique for highlighting defects in thin Si/SiGe bilayers Bedell SW, Sadana DK, Fogel K, Chen H, Domenicucci A Electrochemical and Solid State Letters, 7(5), G105, 2004 |
| 2 |
Qualification of 300 mm SOICMOS substrate material: readiness for development and manufacturing Hovel H, Almonte M, Tsai P, Lee JD, Maurer S, Kleinhenz R, Schepis D, Murphy R, Ronsheim P, Domenicucci A, Bettinger J, Sadana D Solid-State Electronics, 48(6), 1065, 2004 |