검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Analytical model for thin-film SOI PIN-diode leakage current Schmidt A, Dreiner S, Vogt H, Goehlich A, Paschen U Solid-State Electronics, 130, 4, 2017 |
| 2 |
Sb/Si(110) 2x3 - a photoelectron diffraction study Schurmann M, Dreiner S, Berges U, Westphal C Applied Surface Science, 212, 131, 2003 |
| 3 |
Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2 X 1-reconstructed Si(100) surfaces Dreiner S, Westphal C, Schurmann M, Zacharias H Thin Solid Films, 428(1-2), 123, 2003 |
| 4 |
The role of the Si-suboxide structure at the interface: an angle-scanned photoelectron diffraction study Westphal C, Dreiner S, Schurmann M, Senf F, Zacharias H Thin Solid Films, 400(1-2), 101, 2001 |