검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Structure and Formation of Trivalent Chromium Conversion Coatings Containing Cobalt on Zinc Plated Steel Hesamedini S, Ecke G, Bund A Journal of the Electrochemical Society, 165(10), C657, 2018 |
| 2 |
Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N-2 and O-2+N-2 ambients Liday J, Hotovy I, Sitter H, Schmidegg K, Vogrincic P, Bonnani A, Breza J, Ecke G, Vavra I Applied Surface Science, 253(6), 3174, 2007 |
| 3 |
Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering Koufaki M, Sifakis M, Iliopoulos E, Pelekanos N, Modreanu A, Cimalla V, Ecke G, Aperathitis E Applied Surface Science, 253(1), 405, 2006 |
| 4 |
Nucleation control in FLASIC assisted short time liquid phase epitaxy by melt modification Pezoldt J, Polychroniadis E, Stauden T, Ecke G, Chassagne T, Vennegues P, Leycuras A, Panknin D, Stoemenos J, Skorupa W Materials Science Forum, 483, 213, 2005 |
| 5 |
Comparison of normal and inverse poly(3-hexylthiophene)/fullerene solar cell architectures Al-Ibrahim M, Sensfuss S, Uziel J, Ecke G, Ambacher O Solar Energy Materials and Solar Cells, 85(2), 277, 2005 |
| 6 |
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part I. Microstructures and mechanical properties Gubisch M, Liu Y, Spiess L, Romanus H, Krischok S, Ecke G, Schaefer JA, Knedlik C Thin Solid Films, 488(1-2), 132, 2005 |
| 7 |
Growth of AlxGa1-xN-layers on planar and patterned substrates Rossow U, Fuhrmann D, Greve M, Blasing J, Krost A, Ecke G, Riedel N, Hangleiter A Journal of Crystal Growth, 272(1-4), 506, 2004 |
| 8 |
Etching of SiC with fluorine ECR plasma Forster C, Cimalla V, Kosiba R, Ecke G, Weih P, Ambacher O, Pezoldt J Materials Science Forum, 457-460, 821, 2004 |
| 9 |
Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering Aperathitis E, Modreanu M, Bender M, Cimalla V, Ecke G, Androulidaki M, Pelekanos N Thin Solid Films, 450(1), 101, 2004 |
| 10 |
Auger electron spectroscopy investigation of sputter induced altered layers in SiC by low energy sputter depth profiling and factor analysis Kosiba R, Ecke G, Liday J, Breza J, Ambacher O Applied Surface Science, 220(1-4), 304, 2003 |