검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Determination of pore size distribution in thin organized mesoporous silica films by spectroscopic ellipsometry in the visible and infrared range Bourgeois A, Bruneau AB, Fisson S, Demarets B, Grosso D, Cagnol F, Sanchez C, Rivory J Thin Solid Films, 447, 46, 2004 |
| 2 |
Dielectric function of Si nanocrystals embedded in SiO2 Gallas B, Kao CC, Defranoux C, Fisson S, Vuye G, Rivory J Thin Solid Films, 455-56, 335, 2004 |
| 3 |
Description of the porosity of inhomogeneous porous low-k films using solvent adsorption studied by spectroscopic ellipsometry in the visible range Bourgeois A, Bruneau AB, Jousseaume V, Rochat N, Fisson S, Demarets B, Rivory J Thin Solid Films, 455-56, 366, 2004 |
| 4 |
Laser annealing of SiOx thin films Gallas B, Kao CC, Fisson S, Vuye G, Rivory J, Bernard Y, Belouet C Applied Surface Science, 185(3-4), 317, 2002 |
| 5 |
Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition Leprince-Wang Y, Souche D, Yu-Zhang K, Fisson S, Vuye G, Rivory J Thin Solid Films, 359(2), 171, 2000 |
| 6 |
Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity Brunet-Bruneau A, Fisson S, Gallas B, Vuye G, Rivory J Thin Solid Films, 377-378, 57, 2000 |
| 7 |
Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors Gallas B, Fisson S, Brunet-Bruneau A, Vuye G, Rivory J Thin Solid Films, 377-378, 62, 2000 |
| 8 |
Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry Brunet-Bruneau A, Souche D, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Journal of Vacuum Science & Technology A, 16(4), 2281, 1998 |
| 9 |
Visible and infrared ellipsometry study of ion assisted SiO2 films Souche D, Brunet-Bruneau A, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Thin Solid Films, 313-314, 676, 1998 |
| 10 |
Initial-Stages in the Formation of PtSi on Si(111) as Followed by Photoemission and Spectroscopic Ellipsometry Ley L, Wang Y, Van VN, Fisson S, Souche D, Vuye G, Rivory J Thin Solid Films, 270(1-2), 561, 1995 |