검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Atomistic comparative study of VUV photodeposited silicon nitride on InP(100) by simulation and atomic force microscopy Flicstein J, Guillonneau E, Marquez J, Chun LSHK, Maisonneuve D, David C, Wang Z, Palmier JF, Courant JL Applied Surface Science, 154, 337, 2000 |
| 2 |
Very high-resolution focused ion beam nanolithography improvement: A new three-dimensional patterning capability Gierak J, Cambril E, Schneider M, David C, Mailly D, Flicstein J, Schmid G Journal of Vacuum Science & Technology B, 17(6), 3132, 1999 |