화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Strain relaxation induced surface morphology of heterogeneous GaInNAs layers grown on GaAs substrate
Gelczuk L, Jozwiak G, Moczala M, Dluzewski P, Dabrowska-Szata M, Gotszalk TP
Journal of Crystal Growth, 470, 108, 2017
2 Anisotropy of strain relaxation in heterogeneous GaInNAs layers grown by AP-MOVPE
Gelczuk L, Pucicki D, Serafinczuk J, Dabrowska-Szata M, Dluzewski P
Journal of Crystal Growth, 430, 14, 2015
3 Characterization of deep electron traps in 4H-SiC Junction Barrier Schottky rectifiers
Gelczuk L, Dabrowska-Szata M, Sochacki M, Szmidt J
Solid-State Electronics, 94, 56, 2014
4 Correlation between barrier inhomogeneities of 4H-SiC 1 A/600 V Schottky rectifiers and deep-level defects revealed by DLTS and Laplace DLTS
Gelczuk L, Kamyczek P, Placzek-Popko E, Dabrowska-Szata M
Solid-State Electronics, 99, 1, 2014
5 Anisotropic misfit strain relaxation in lattice mismatched InGaAs/GaAs heterostructures grown by MOVPE
Gelczuk L, Serafinczuk J, Darowska-Szata M, Dluzewski P
Journal of Crystal Growth, 310(12), 3014, 2008