화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Challenges in etch: What's new?
Gottscho RA, Nojiri K, LaCara J
Thin Solid Films, 516(11), 3493, 2008
2 Semiempirical profile simulation of aluminum etching in Cl-2/BCl3 plasma
Cooperberg DJ, Vahedi V, Gottscho RA
Journal of Vacuum Science & Technology A, 20(5), 1536, 2002
3 Substrate Effect on Plasma-Enhanced Chemical-Vapor-Deposited Silicon-Nitride
Sherman S, Wagner S, Mucha J, Gottscho RA
Journal of the Electrochemical Society, 144(9), 3198, 1997
4 Scaling of Si and GaAs Trench Etch Rates with Aspect Ratio, Feature Width, and Substrate-Temperature (Vol 13, Pg 92, 1995)
Bailey AD, Vandesanden MC, Gregus JA, Gottscho RA
Journal of Vacuum Science & Technology B, 15(2), 373, 1997
5 Scaling of Si and GaAs Trench Etch Rates with Aspect Ratio, Feature Width, and Substrate-Temperature
Bailey AD, Vandesanden MC, Gregus JA, Gottscho RA
Journal of Vacuum Science & Technology B, 13(1), 92, 1995
6 Real-Time in-Situ Monitoring of Surfaces During Glow-Discharge Processing - NH3 and H-2 Plasma Passivation of GaAs
Aydil ES, Zhou ZH, Gottscho RA, Chabal YJ
Journal of Vacuum Science & Technology B, 13(2), 258, 1995
7 Comparison of Advanced Plasma Sources for Etching Applications .1. Etching Rate, Uniformity, and Profile Control in a Helicon and a Multiple Electron-Cyclotron-Resonance Source
Tepermeister I, Blayo N, Klemens FP, Ibbotson DE, Gottscho RA, Lee JT, Sawin HH
Journal of Vacuum Science & Technology B, 12(4), 2310, 1994
8 Ion Velocity Distributions in Helicon Wave Plasmas - Magnetic-Field and Pressure Effects
Nakano T, Giapis KP, Gottscho RA, Lee TC, Sadeghi N
Journal of Vacuum Science & Technology B, 11(6), 2046, 1993
9 Real-Time Latent Image Monitoring During Holographic Fabrication of Submicron Diffraction Gratings
Gregus JA, Green CA, Yoon E, Ostermayer FW, Hayes TR, Pawelek R, Gottscho RA, Sohail S, Naqvi H
Journal of Vacuum Science & Technology B, 11(6), 2468, 1993