화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Impact of supercritical CO2 drying on roughness of hydrogen silsesquioxane e-beam resist
Kupper D, Kupper D, Wahlbrink T, Henschel W, Bolten J, Lemme MC, Georgiev YM, Kurz H
Journal of Vacuum Science & Technology B, 24(2), 570, 2006
2 Contactless capturing of particles in liquid using pulsed alternating dielectrophoresis
Luo CP, Heeren A, Henschel W, Fleischer M, Kern DP
Journal of Vacuum Science & Technology B, 24(6), 3184, 2006
3 Characterization and operation of a mechanically actuated silicon microgripper
Blideran MM, Fleischer M, Henschel W, Kern DP, Sterr J, Schock K, Kleindiek S, Langer MG, Loffler K, Grauvogel F
Journal of Vacuum Science & Technology B, 24(6), 3239, 2006
4 High resolution electron beam lithography using a chemically amplified calix[4]arene based resist
Sailer H, Ruderisch A, Henschel W, Schurig V, Kern DP
Journal of Vacuum Science & Technology B, 22(6), 3485, 2004
5 Subthreshold behavior of triple-gate MOSFETs on SOI material
Lemme MC, Mollenhauer T, Henschel W, Wahlbrink T, Baus M, Winkler O, Granzner R, Schwierz F, Spangenberg B, Kurz H
Solid-State Electronics, 48(4), 529, 2004
6 Electrical characterization of 12 nm EJ-MOSFETs on SOI substrates
Henschel W, Wahlbrink T, Georgiev YM, Lemme M, Mollenhauer T, Vratzov B, Fuchs A, Kurz H, Kittler M, Schwierz F
Solid-State Electronics, 48(5), 739, 2004
7 Study of a high contrast process for hydrogen silsesquioxane as a negative tone electron beam resist
Henschel W, Georgiev YM, Kurz H
Journal of Vacuum Science & Technology B, 21(5), 2018, 2003
8 Large scale ultraviolet-based nanoimprint lithography
Vratzov B, Fuchs A, Lemme M, Henschel W, Kurz H
Journal of Vacuum Science & Technology B, 21(6), 2760, 2003
9 Fabrication of 12 nm electrically variable shallow junction metal-oxide-semiconductor field effect transistors on silicon on insulator substrates
Henschel W, Wahlbrink T, Geogriev YM, Lemme M, Mollenhauer T, Vratzov B, Fuchs A, Kurz H
Journal of Vacuum Science & Technology B, 21(6), 2975, 2003
10 Simulation and optimization of EJ-MOSFETs
Kittler M, Granzner R, Schwierz F, Henschel W, Wahlbrink T, Kurz H
Solid-State Electronics, 47(7), 1193, 2003