화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Addition of HfO2 interface layer for improved synaptic performance of phase change memory (PCM) devices
Suri M, Bichler O, Hubert Q, Perniola L, Sousa V, Jahan C, Vuillaume D, Gamrat C, DeSalvo B
Solid-State Electronics, 79, 227, 2013
2 Carbon-doped GeTe: A promising material for Phase-Change Memories
Beneventi GB, Perniola L, Sousa V, Gourvest E, Maitrejean S, Bastien JC, Bastard A, Hyot B, Fargeix A, Jahan C, Nodin JF, Persico A, Fantini A, Blachier D, Toffoli A, Loubriat S, Roule A, Lhostis S, Feldis H, Reimbold G, Billon T, De Salvo B, Larcher L, Pavan P, Bensahel D, Mazoyer P, Annunziata R, Zuliani P, Boulanger F
Solid-State Electronics, 65-66, 197, 2011
3 Lateral coupling and immunity to substrate effect in Omega FET devices
Ritzenthaler R, Cristoloveanu S, Faynot O, Jahan C, Kuriyama A, Brevard L, Deleonibus S
Solid-State Electronics, 50(4), 558, 2006
4 Agglomeration control during the selective epitaxial growth of Si raised sources and drains on ultra-thin silicon-on-insulator substrates
Jahan C, Faynot O, Tosti L, Hartmann JM
Journal of Crystal Growth, 280(3-4), 530, 2005
5 Selective epitaxial growth of boron- and phosphorus-doped Si and SiGe for raised sources and drains
Hartmann JM, Clavelier L, Jahan C, Holliger P, Rolland G, Billon T, Defranoux C
Journal of Crystal Growth, 264(1-3), 36, 2004