검색결과 : 32건
No. | Article |
---|---|
1 |
Phase degradation in BxGa1-xN films grown at low temperature by metalorganic vapor phase epitaxy Gunning BP, Moseley MW, Koleske DD, Allerman AA, Lee SR Journal of Crystal Growth, 464, 190, 2017 |
2 |
Photoelectrochemical etching of epitaxial InGaN thin films: self-limited kinetics and nanostructuring Xiao XY, Fischer AJ, Coltrin ME, Lu P, Koleske DD, Wang GT, Polsky R, Tsao JY Electrochimica Acta, 162, 163, 2015 |
3 |
On the increased efficiency in InGaN-based multiple quantum wells emitting at 530-590 nm with AlGaN interlayers Koleske DD, Fischer AJ, Bryant BN, Kotula PG, Wierer JJ Journal of Crystal Growth, 415, 57, 2015 |
4 |
Controlling indium incorporation in InGaN barriers with dilute hydrogen flows Koleske DD, Wierer JJ, Fischer AJ, Lee SR Journal of Crystal Growth, 390, 38, 2014 |
5 |
Connection between GaN and InGaN growth mechanisms and surface morphology Koleske DD, Lee SR, Crawford MH, Cross KC, Coltrin ME, Kempisty JM Journal of Crystal Growth, 391, 85, 2014 |
6 |
Effect of interface grading and lateral thickness variation on x-ray diffraction by InGaN/GaN multiple quantum wells Lee SR, Koleske DD, Crawford MH, Wierer JJ Journal of Crystal Growth, 355(1), 63, 2012 |
7 |
Log-Pile TiO2 Photonic Crystal for Light Control at Near-UV and Visible Wavelengths Subramania G, Lee YJ, Fischer AJ, Koleske DD Advanced Materials, 22(4), 487, 2010 |
8 |
Thermal stability of thin InGaN films on GaN Thaler GT, Koleske DD, Lee SR, Bogart KHA, Crawford MH Journal of Crystal Growth, 312(11), 1817, 2010 |
9 |
Pyrolysis of two-dimensional and three-dimensional interferometrically patterned resist structures Burckel DB, Washburn CM, Koleske DD, Polsky R Journal of Vacuum Science & Technology B, 28(6), C6P14, 2010 |
10 |
Emissivity-correcting mid-infrared pyrometry for group-III nitride MOCVD temperature measurement and control Creighton JR, Breiland WG, Koleske DD, Thaler G, Crawford MH Journal of Crystal Growth, 310(6), 1062, 2008 |