검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Silicon interface trap characterization with elastic metal gate metrology Kraus PA, Ho N, Bae SH, Olsen CS Journal of Vacuum Science & Technology B, 23(5), 2240, 2005 |
| No. | Article |
|---|---|
| 1 |
Silicon interface trap characterization with elastic metal gate metrology Kraus PA, Ho N, Bae SH, Olsen CS Journal of Vacuum Science & Technology B, 23(5), 2240, 2005 |