검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Reliability concern and design for the lateral insulator gate bipolar transistor based on SOI substrate Liu SY, Huang TT, Sun WF, Zhang CW Solid-State Electronics, 85, 28, 2013 |
| 2 |
Comparisons of hot-carrier degradation behavior in SOI-LIGBT and SOI-LDMOS with different stress conditions Liu SY, Sun WF, Qian QS, Zhu J Solid-State Electronics, 54(12), 1598, 2010 |