화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 X-ray photoernission and X-ray absorption studies of Hf-silicate dielectric layers
O'Connor R, Hughes G, Glans PA, Learmonth T, Smith KE
Applied Surface Science, 253(5), 2770, 2006
2 Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering
Zhang YF, Downes JE, Wang SC, Learmonth T, Plucinski L, Matsuura AY, McGuinness C, Glans PA, Bernardis S, O'Donnell C, Smith KE
Thin Solid Films, 515(2), 394, 2006
3 Electronic excitations in vanadium oxide phthalocyanine studied via resonant soft X-ray emission and resonant inelastic X-ray scattering
Zhang YF, Wang SC, Learmonth T, Plucinski L, Matsuura AY, Bernardis S, O'Donnell C, Downes JE, Smith KE
Chemical Physics Letters, 413(1-3), 95, 2005
4 Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine
Downes JE, McGuinness C, Glans PA, Learmonth T, Fu DF, Sheridan P, Smith KE
Chemical Physics Letters, 390(1-3), 203, 2004
5 On the involvement of the shallow core 5d level in the bonding in HgO
Glans PA, Learmonth T, McGuinness C, Smith KE, Guo JH, Walsh A, Watson GW, Egdell RG
Chemical Physics Letters, 399(1-3), 98, 2004