검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Influence of Electrostatic Forces on the Investigation of Dopant Atoms in Layered Semiconductors by Scanning Tunneling Microscopy/Spectroscopy and Atomic-Force Microscopy Schlaf R, Louder D, Nelson MW, Parkinson BA Journal of Vacuum Science & Technology A, 15(3), 1466, 1997 |
| 2 |
Molecular-Beam Epitaxy Growth of Thin-Films of Sns2 and Snse2 on Cleaved Mica and the Basal Planes of Single-Crystal Layered Semiconductors - Reflection High-Energy Electron-Diffraction, Low-Energy-Electron Diffraction, Photoemission, and Scanning-Tunneling-Microscopy Atomic-Force Microscopy Characterization Schlaf R, Louder D, Lang O, Pettenkofer C, Jaegermann W, Nebesny KW, Lee PA, Parkinson BA, Armstrong NR Journal of Vacuum Science & Technology A, 13(3), 1761, 1995 |