화학공학소재연구정보센터
Journal of Vacuum Science & Technology A, Vol.13, No.3, 1761-1767, 1995
Molecular-Beam Epitaxy Growth of Thin-Films of Sns2 and Snse2 on Cleaved Mica and the Basal Planes of Single-Crystal Layered Semiconductors - Reflection High-Energy Electron-Diffraction, Low-Energy-Electron Diffraction, Photoemission, and Scanning-Tunneling-Microscopy Atomic-Force Microscopy Characterization