검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Depth profiling of organic materials using improved ion beam conditions Cramer HG, Grehl T, Kollmer F, Moellers R, Niehuis E, Rading D Applied Surface Science, 255(4), 966, 2008 |
| 2 |
Cesium near-surface concentration in low energy, negative mode dynamic SIMS Berghmans B, Van Daele B, Geenen L, Conard T, Franquet A, Vandervorst W Applied Surface Science, 255(4), 1316, 2008 |
| 3 |
High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ions Ninomiya S, Aoki T, Seki T, Matsuo J Applied Surface Science, 252(19), 6550, 2006 |
| 4 |
Secondary ion measurements for oxygen cluster ion SIMS Ninomiya S, Aoki T, Seki T, Matsuo J Applied Surface Science, 252(19), 7290, 2006 |