| 1 |
Sequential lateral crystallization of amorphous silicon on glass by blue laser annealing for high mobility thin-film transistors
Jung YH, Hon S, Lee S, Jin S, Kim TW, Chang Y, Jang J
Thin Solid Films, 681, 93, 2019 |
| 2 |
Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays
Bae MS, Park C, Shin D, Lee SM, Yun I
Solid-State Electronics, 133, 1, 2017 |
| 3 |
Power dependence of orientation in low-temperature poly-Si lateral grains crystallized by a continuous-wave laser scan
Sasaki N, Nieda Y, Hishitani D, Uraoka Y
Thin Solid Films, 631, 112, 2017 |
| 4 |
Low temperature polycrystalline silicon with single orientation on glass by blue laser annealing
Jin S, Hong S, Mativenga M, Kim B, Shin HH, Park JK, Kim TW, Jang J
Thin Solid Films, 616, 838, 2016 |
| 5 |
Thermally generated leakage current mechanisms of metal-induced laterally crystallized n-type poly-Si TFTs under hot-carrier stress
Zhu Z
Solid-State Electronics, 62(1), 62, 2011 |
| 6 |
Arc-instability generated during the Joule heating induced crystallization of amorphous silicon films
Hong WE, Ro JS
Thin Solid Films, 519(7), 2371, 2011 |
| 7 |
Investigation of source-follower type analog buffer using low temperature poly-Si TFTs
Chen BT, Tai YH, Wei YJ, Wei KF, Tsai CC, Huang CY, Kuo YJ, Cheng HC
Solid-State Electronics, 51(3), 354, 2007 |
| 8 |
New pixel circuits for driving active matrix organic light emitting diodes
Chen BT, Tai YH, Kuo YJ, Tsai CC, Cheng HC
Solid-State Electronics, 50(2), 272, 2006 |
| 9 |
Thermal degradation of low temperature poly-Si TFT
Fuyuki T, Kitajima K, Yano H, Hatayama T, Uraoka Y, Hashimoto S, Morita Y
Thin Solid Films, 487(1-2), 216, 2005 |
