화학공학소재연구정보센터
검색결과 : 36건
No. Article
1 Molecular beam epitaxy, atomic layer deposition, and multiple functions connected via ultra-high vacuum
Lin KY, Wan HW, Chen KHM, Fanchiang YT, Chen WS, Lin YH, Cheng YT, Chen CC, Lin HY, Young LB, Cheng CP, Pi TW, Kwo J, Hong M
Journal of Crystal Growth, 512, 223, 2019
2 Controllable growth of stable germanium dioxide ultra-thin layer by means of capacitively driven radio frequency discharge
Svarnas P, Botzakaki MA, Skoulatakis G, Kennou S, Ladas S, Tsamis C, Georga SN, Krontiras CA
Thin Solid Films, 599, 49, 2016
3 Corner induced non-uniform electric field effect on the electrical reliability of metal-oxide-semiconductor devices with non-planar substrates
Tseng PH, Hwu JG
Solid-State Electronics, 91, 100, 2014
4 Explicit drain current model of junctionless double-gate field-effect transistors
Yesayan A, Pregaldiny F, Sallese JM
Solid-State Electronics, 89, 134, 2013
5 Drain-extended MOS transistors capable for operation at 10 V and at radio frequencies
Mai A, Rucker H
Solid-State Electronics, 65-66, 45, 2011
6 Resistive switching-like behavior of the dielectric breakdown in ultra-thin Hf based gate stacks in MOSFETs
Crespo-Yepes A, Martin-Martinez J, Rothschild A, Rodriguez R, Nafria M, Aymerich X
Solid-State Electronics, 65-66, 157, 2011
7 Elimination of GeO2 and Ge3N4 interfacial transition regions and defects at n-type Ge interfaces: A pathway for formation of n-MOS devices on Ge substrates
Lucovsky G, Lee S, Long JP, Seo H, Luning J
Applied Surface Science, 254(23), 7933, 2008
8 High injection regime of the super barrier (TM) rectifier
Rodov V, Ankudinov AL, Ghosh P
Solid-State Electronics, 51(5), 714, 2007
9 Dose radiation effects in FinFETs
Wu XS, Chan PCH, Orozco A, Vazquez A, Chaudhry A, Colinge JP
Solid-State Electronics, 50(2), 287, 2006
10 Characterization of hot-carrier degraded SiGe/Si-hetero-PMOSFETs
Tsuchiya T, Sakuraba M, Murota J
Thin Solid Films, 508(1-2), 326, 2006