화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 High-rate epitaxial growth of 4H-SiC using a vertical-type, quasi-hot-wall CVD reactor
Masahara K, Takahashi T, Kushibe M, Ohno T, Nishio J, Kojima K, Ishida Y, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 389-3, 179, 2002
2 Epitaxial growth of (1120) 4H-SiC using substrate grown in the [1120] direction
Kojima K, Ohno T, Senzaki J, Fukuda K, Fujimoto T, Katsuno M, Ohtani N, Nishino J, Masahara K, Ishida Y, Takahashi T, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 389-3, 195, 2002
3 Investigation of residual impurities in 4H-SiC epitaxial layers grown by hot-wall chemical vapor deposition
Nishio J, Kushibe M, Masahara K, Kojima K, Ohno T, Ishida Y, Takahashi T, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 389-3, 215, 2002
4 Simulation of high-temperature SiC epitaxial growth using vertical, quasi-hot-wall CVD reactor
Hasegawa M, Miyauchi A, Masahara K, Ishida Y, Takahashi T, Ohno T, Nishio J, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 389-3, 227, 2002
5 Replication of defects from 4H-SiC wafer to epitaxial layer
Ohno T, Yamaguchi H, Kojima K, Nishio J, Masahara K, Ishida Y, Takahashi T, Suzuki T, Yoshida S
Materials Science Forum, 389-3, 447, 2002
6 Distribution profile of deep levels in SiC observed by isothermal capacitance transient spectroscopy
Fujimaki M, Ono R, Kushibe M, Masahara K, Kojima K, Shinohe T, Okushi H, Arai K
Materials Science Forum, 389-3, 851, 2002
7 Influence of the crystalline quality of epitaxial layers on inversion channel mobility in 4H-SiC MOSFETs
Kojima K, Ohno T, Suzuki S, Senzaki J, Harada S, Fukuda K, Kushibe M, Masahara K, Ishida Y, Takahashi T, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 389-3, 1053, 2002
8 Control of surface morphologies for epitaxial growth on low off-anglie 4H-SiC (0001) substrates
Masahara K, Kushibe M, Ohno H, Kojima K, Takahashi T, Ishida Y, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 353-356, 135, 2001
9 Competitive growth between deposition and etching in 4H-SiC CVD epitaxy using quasi-hot wail reactor
Kushibe M, Ishida Y, Okumura H, Takahashi T, Masahara K, Ohno T, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 338-3, 169, 2000
10 Pre-growth treatment of 4H-SiC substrates by hydrogen etching at low pressure
Masahara K, Ishida Y, Okumura H, Takahashi T, Kushibe M, Ohno T, Suzuki T, Tanaka T, Yoshida S, Arai K
Materials Science Forum, 338-3, 1037, 2000