화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Process Engineering Study of the Homogenously Catalyzed Biodiesel Synthesis in a Bubble Column Reactor
Mollenhauer T, Klemm W, Lauterbach M, Ondruschka B, Haupt J
Industrial & Engineering Chemistry Research, 49(24), 12390, 2010
2 Leakage current mechanisms in epitaxial Gd2O3 high-k gate dielectrics
Gottlob HDB, Echtermeyer TJ, Schmidt M, Mollenhauer T, Wahlbrink T, Lemme MC, Kurz H
Electrochemical and Solid State Letters, 11(3), G12, 2008
3 Investigation of MOS capacitors and SOI-MOSFETs with epitaxial gadolinium oxide (Gd2O3) and titanium nitride (TiN) electrodes
Echtermeyer T, Gottlob HDB, Wahlbrink T, Mollenhauer T, Schmidt M, Efavi JK, Lemme MC, Kurz H
Solid-State Electronics, 51(4), 617, 2007
4 Scalable gate first process for silicon on insulator metal oxide semiconductor field effect transistors with epitaxial high-k dielectrics
Gottlob HDB, Mollenhauer T, Wahlbrink T, Schmidt M, Echtermeyer T, Efavi JK, Lemme MC, Kurz H
Journal of Vacuum Science & Technology B, 24(2), 710, 2006
5 Nanowire fin field effect transistors via UV-based nanoimprint lithography
Fuchs A, Bender M, Plachetka U, Kock L, Wahlbrink T, Gottlob HDB, Efavi JK, Moeller M, Schmidt M, Mollenhauer T, Moormann C, Lemme MC, Kurz H
Journal of Vacuum Science & Technology B, 24(6), 2964, 2006
6 CMOS integration of epitaxial Gd2O3 high-k gate dielectrics
Gottlob HDB, Echtermeyer T, Mollenhauer T, Efavi JK, Schmidt M, Wahlbrink T, Lemme MC, Kurz H, Czernohorsky M, Bugiel E, Osten HJ, Fissel A
Solid-State Electronics, 50(6), 979, 2006
7 Subthreshold behavior of triple-gate MOSFETs on SOI material
Lemme MC, Mollenhauer T, Henschel W, Wahlbrink T, Baus M, Winkler O, Granzner R, Schwierz F, Spangenberg B, Kurz H
Solid-State Electronics, 48(4), 529, 2004
8 Electrical characterization of 12 nm EJ-MOSFETs on SOI substrates
Henschel W, Wahlbrink T, Georgiev YM, Lemme M, Mollenhauer T, Vratzov B, Fuchs A, Kurz H, Kittler M, Schwierz F
Solid-State Electronics, 48(5), 739, 2004
9 Fabrication of 12 nm electrically variable shallow junction metal-oxide-semiconductor field effect transistors on silicon on insulator substrates
Henschel W, Wahlbrink T, Geogriev YM, Lemme M, Mollenhauer T, Vratzov B, Fuchs A, Kurz H
Journal of Vacuum Science & Technology B, 21(6), 2975, 2003