검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Microstructure Effect on the Oxygen Permeation through Ba0.95La0.05FeO3-delta Membranes Fabricated by Different Methods Watanabe K, Ninomiya S, Yuasa M, Kida T, Yamazoe N, Haneda H, Shimanoe K Journal of the American Ceramic Society, 93(7), 2012, 2010 |
| 2 |
Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditions Ninomiya S, Ichiki K, Nakata Y, Honda Y, Seki T, Aoki T, Matsuo J Applied Surface Science, 255(4), 880, 2008 |
| 3 |
MD simulation study of the sputtering process by high-energy gas cluster impact Aoki T, Seki T, Ninomiya S, Matsuo J Applied Surface Science, 255(4), 944, 2008 |
| 4 |
High sputtering yields of organic compounds by large gas cluster ions Ichiki K, Ninomiya S, Nakata Y, Honda Y, Seki T, Aoki T, Matsuo J Applied Surface Science, 255(4), 1148, 2008 |
| 5 |
What size of cluster is most appropriate for SIMS? Matsuo J, Ninomiya S, Nakata Y, Honda Y, Ichiki K, Seki T, Aoki T Applied Surface Science, 255(4), 1235, 2008 |
| 6 |
A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions Ninomiya S, Nakata Y, Honda Y, Ichiki K, Seki T, Aoki T, Matsuo J Applied Surface Science, 255(4), 1588, 2008 |
| 7 |
Yield enhancement of molecular ions with MeV ion-induced electronic excitation Nakata Y, Honda Y, Ninomiya S, Seki T, Aoki T, Matsuo J Applied Surface Science, 255(4), 1591, 2008 |
| 8 |
High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ions Ninomiya S, Aoki T, Seki T, Matsuo J Applied Surface Science, 252(19), 6550, 2006 |
| 9 |
Secondary ion measurements for oxygen cluster ion SIMS Ninomiya S, Aoki T, Seki T, Matsuo J Applied Surface Science, 252(19), 7290, 2006 |
| 10 |
SiC Thin-Film Preparation by ArF Excimer-Laser Chemical-Vapor-Deposition .1. Rate of Photolysis of Alkylsilanes by ArF Excimer-Laser and Their Decomposition Products Watanabe A, Osato K, Ninomiya S, Mukaida M, Tsunoda T, Imai Y Thin Solid Films, 274(1-2), 70, 1996 |