검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
An analysis of the factors affecting the alpha parameter used for extracting surface recombination velocity in EBIC measurements Kurniawan O, Ong VKS Solid-State Electronics, 50(3), 345, 2006 |
| 2 |
Extracting diffusion length using the single contact electron beam induced current technique Ong VKS, Wu D Solid-State Electronics, 44(9), 1585, 2000 |