검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Accurate Determination of Shallow Doping Profiles and Interface States for Metal-Oxide-Semiconductor Structures from Measured Capacitance-Voltage Data Osse AL, Krusius JP, Weinzierl S Journal of Vacuum Science & Technology B, 12(1), 342, 1994 |