화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Extraction method for parasitic capacitances and inductances of HEMT models
Zhang HS, Ma PJ, Lu Y, Zhao BC, Zheng JX, Ma XH, Hao Y
Solid-State Electronics, 129, 108, 2017
2 Effect of parasitic elements on UTBB FD SOI MOSFETs RF figures of merit
Arshad MKM, Kilchytska V, Emam M, Andrieu F, Flandre D, Raskin JP
Solid-State Electronics, 97, 38, 2014
3 Comparative study of circuit perspectives for multi-gate structures at sub-10 nm node
Lacord J, Huguenin JL, Monfray S, Coquand R, Skotnicki T, Ghibaudo G, Boeuf F
Solid-State Electronics, 74, 25, 2012
4 A compact model of fringing field induced parasitic capacitance for deep sub-micrometer MOSFETs
Liu X, Jin X, Lee JH
Solid-State Electronics, 53(9), 1041, 2009
5 Compact model for highly-doped double-gate SOI MOSFETs targeting baseband analog applications
Moldovan O, Cerdeira A, Jimenez D, Raskin JP, Kilchytska V, Flandre D, Collaert N, Iniguez B
Solid-State Electronics, 51(5), 655, 2007