검색결과 : 1건
No. | Article |
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1 |
Identification of Plasma-Induced Failure Modes in the Development of a Bipolar-Complementary Metal-Oxide-Semiconductor Process Hackenberg JJ, Dion MJ, Hemmenway DF, Pearce LG, Werner JW Journal of Vacuum Science & Technology A, 13(3), 943, 1995 |