검색결과 : 10건
No. | Article |
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1 |
Analysis of mass transfer and morphometric characteristics of white mushroom (Agaricus bisporus) pilei during osmotic dehydration Gonzalez-Perez JE, Lopez-Mendez EM, Luna-Guevara JJ, Ruiz-Espinosa H, Ochoa-Velasco CE, Ruiz-Lopez II Journal of Food Engineering, 240, 120, 2019 |
2 |
Mass transfer and morphometric characteristics of fresh and osmodehydrated white mushroom pilei during convective drying Gonzalez-Perez JE, Lopez-Mendez EM, Ochoa-Velasco CE, Ruiz-Lopez II Journal of Food Engineering, 262, 181, 2019 |
3 |
Atmospheric Decomposition of Trifluoromethanol Catalyzed by Formic Acid Parandaman A, Perez JE, Sinha A Journal of Physical Chemistry A, 122(49), 9553, 2018 |
4 |
Oxygenate-Induced Tuning of Aldehyde-Amine Reactivity and Its Atmospheric Implications Perez JE, Kumar M, Francisco JS, Sinha A Journal of Physical Chemistry A, 121(5), 1022, 2017 |
5 |
Terahertz imaging using strained-Si MODFETs as sensors Meziani YM, Garcia-Garcia E, Velazquez-Perez JE, Coquillat D, Dyakonova N, Knap W, Grigelionis I, Fobelets K Solid-State Electronics, 83, 113, 2013 |
6 |
Transport boundary conditions for solar cells Volovichev IN, Velazquez-Perez JE, Gurevich YG Solar Energy Materials and Solar Cells, 93(1), 6, 2009 |
7 |
Transport boundary condition for semiconductor structures Volovichev IN, Velazquez-Perez JE, Gurevich YG Solid-State Electronics, 52(11), 1703, 2008 |
8 |
A novel 3D embedded gate field effect transistor - Screen-grid FET -Device concept and modelling Fobelets K, Ding PW, Velazquez-Perez JE Solid-State Electronics, 51(5), 749, 2007 |
9 |
Effect of temperature on the transfer characteristic of a 0.5 mu m-gate Si : SiGe depletion-mode n-MODFET Gaspari V, Fobelets K, Velazquez-Perez JE, Ferguson R, Michelakis K, Despotopoulos S, Papavassilliou C Applied Surface Science, 224(1-4), 390, 2004 |
10 |
Comparison of sub-micron Si : SiGe heterojunction nFETs to Si nMOSFET in present-day technologies Fobelets K, Jeamsaksiri W, Papavasilliou C, Vilches T, Gaspari V, Velazquez-Perez JE, Michelakis K, Hackbarth T, Konig U Solid-State Electronics, 48(8), 1401, 2004 |