검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Reliability of ultra-thin film deep submicron SIMOX nMOSFETs Potavin O, Haendler S, Jomaah J, Balestra F, Raynaud C Solid-State Electronics, 46(3), 367, 2002 |
| No. | Article |
|---|---|
| 1 |
Reliability of ultra-thin film deep submicron SIMOX nMOSFETs Potavin O, Haendler S, Jomaah J, Balestra F, Raynaud C Solid-State Electronics, 46(3), 367, 2002 |