검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Latest developments for the CAMECA ULE-SIMS instruments: IMS Wf and SC-Ultra de Chambost E, Merkulov A, Peres P, Rasser B, Schuhmacher M Applied Surface Science, 231-2, 949, 2004 |
| 2 |
Depth scale calibration of SIMS depth profiles by means of an online crater depth measurement technique De Chambost E, Monsallut P, Rasser B, Schuhmacher M Applied Surface Science, 203, 391, 2003 |
| 3 |
A new shielded SIMS instrument for analysis of highly radioactive materials Rasser B, Desgranges L, Pasquet B Applied Surface Science, 203, 673, 2003 |
| 4 |
New developments for shallow depth profiling with the Cameca IMS 6f Schuhmacher M, Rasser B, Desse F Journal of Vacuum Science & Technology B, 18(1), 529, 2000 |