검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
A robust 45 nm gate-length CMOSFET for 90 nm Hi-speed technology Lim KY, Chan V, Rengarajan R, Lee HK, Rovedo N, Lim EH, Yang S, Jamin F, Nguyen P, Lin W, Lai CW, Teh YW, Lee J, Kim L, Luo Z, Ng H, Sudijono J, Wann C, Yang I Solid-State Electronics, 50(4), 579, 2006 |