검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
SIMS quantification of matrix and impurity species in AlxGa1-xN Gu CJ, Stevie FA, Hitzman CJ, Saripalli YN, Johnson M, Griffis DP Applied Surface Science, 252(19), 7228, 2006 |
| 2 |
Properties of III-N MOS structures with low-temperature epitaxially regrown ohmic contacts Saripalli YN, Zeng C, Long JP, Barlage DW, Johnson MAL, Braddock D Journal of Crystal Growth, 287(2), 562, 2006 |