검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
Fullerene C-60 as an endohedral molecule within an inorganic supramolecule Scheer M, Schindler A, Merkle R, Johnson BP, Linseis M, Winter R, Anson CE, Virovets AV Journal of the American Chemical Society, 129(44), 13386, 2007 |
| 2 |
Room-temperature ultrahigh vacuum bonding of Ge/GaAs p-n heterojunction wafer using 300 eV hydrogen ion beam surface cleaning Razek N, Schindler A Journal of Vacuum Science & Technology A, 25(5), 1480, 2007 |
| 3 |
Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry Leibiger G, Gottschalch V, Razek N, Schindler A, Schubert M Thin Solid Films, 455-56, 231, 2004 |
| 4 |
Large area smoothing of optical surfaces by low-energy ion beams Frost F, Fechner R, Ziberi B, Flamm D, Schindler A Thin Solid Films, 459(1-2), 100, 2004 |
| 5 |
Influence of preparation parameters for low-energy ion beam nitridation of III-V semiconductor surfaces Hecht JD, Frost F, Sidorenko A, Hirsch D, Neumann H, Schindler A, Krasnikow S, Zhang L, Chasse T Solid-State Electronics, 47(3), 413, 2003 |
| 6 |
GaAs surface cleaning by low energy hydrogen ion beam treatment Razek N, Otte K, Chasse T, Hirsch D, Schindler A, Frost F, Rauschenbach B Journal of Vacuum Science & Technology A, 20(4), 1492, 2002 |
| 7 |
Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering Frost F, Hirsch D, Schindler A Applied Surface Science, 179(1-4), 8, 2001 |
| 8 |
In situ characterization of the nitridation of AIII-BV semiconductor surfaces by means of X-ray photoelectron spectroscopy Hecht JD, Frost F, Chasse T, Hirsch D, Neumann H, Schindler A, Bigl F Applied Surface Science, 179(1-4), 196, 2001 |
| 9 |
Ultrahigh-rate plasma jet chemical etching of silicon Arnold T, Boehm G, Schindler A Journal of Vacuum Science & Technology A, 19(5), 2586, 2001 |
| 10 |
Chemical bath deposition of CdS buffer layer: prospects of increasing materials yield and reducing waste Hariskos D, Powalla M, Chevaldonnet N, Lincot D, Schindler A, Dimmler B Thin Solid Films, 387(1-2), 179, 2001 |