검색결과 : 5건
No. | Article |
---|---|
1 |
ESD protection device design using statistical methods Shigyo N, Kawashima H, Yasuda S Solid-State Electronics, 46(12), 2117, 2002 |
2 |
Mesh related problems in device simulation: Treatments of meshing noise and leakage current Shigyo N, Tanimoto H, Enda T Solid-State Electronics, 44(1), 11, 2000 |
3 |
Technology CAD based statistical simulation of MOSFETs Shigyo N, Wakita N, Morishita T, Sugawara K, Asahi Y Solid-State Electronics, 44(6), 1001, 2000 |
4 |
Verification of overlap and fringing capacitance models for MOSFETs Wakita N, Shigyo N Solid-State Electronics, 44(6), 1105, 2000 |
5 |
An analysis of process fluctuation induced propagation delay variation using analytical model Shigyo N Solid-State Electronics, 44(12), 2183, 2000 |